From SiC to Power GaN, and further to RF GaN and Ferroelectric device reliability, WLab has long been dedicated to reliability research. We continuously explore innovative reliability testing methodologies and the underlying degradation/failure mechanisms, aiming to develop practical strategies to overcome reliability limitations in next-generation compound semiconductors and emerging memory technologies. 📣 Great news! WLab has 6 papers accepted to the 2026 IEEE Internationa

Professor Tian-Li Wu was awarded the 2025 ECE Teaching Award at National Yang Ming Chiao Tung University, in recognition of his...

Professor Tian-Li Wu has been invited to participate in the workshop titled “GaN/Si: an Enabler for FR3 Applications?”  at the 2025 IEEE...

We're thrilled to collaborate with  NVIDIA on accelerating the semiconductor device characteristics prediction with Machine Learning ...

WLab is exciting for Taiwan-Germany Semiconductor Collaboration with NSTC-DFG project on Development and Re liability Improvement of...

Professor Tian-Li Wu is invited to the 2025 VLSI-TSA to share insights on how compound semiconductors are gradually transforming AI...

WLab members have received multiple awards in IEDMS 2024. IEDMS Gold award : H.-J. Ho, Y.-C. Chen, and T.-L. Wu, " Demonstration of High...

On behalf of Editor team with Prof. Uttam Singisetti, Prof. Geonwook Yoo, and me,  I would like to invite you for the submission of...

To foster the next generation of research talent and honor Dr. Ta-You Wu's remarkable contributions to science and technology, Taiwan's...

Prof. Tian-i Wu received the award of NSTC 2030 Young Scholar Program- Excellent Young Scholar