WLab
Advance Semiconductor Technologies
toward Reliability
Prof. Tian-Li Wu
Institute of Electronics
Dept. of Electronics and Electrical Eng.
EECS Int'l Graduate Program
AI Graduate Program
Int'l College of Semiconductor Technology
Joint Researcher in ITRI/TSRI
Ta-You Wu Memorial Awardee
MediaTek Junior Chair Professor
HEA Fellow
IEEE Senior Member
Ph.D. in EE, imec/KU Leuven
Office: ED536
Phone: 03-5712121#59442
tlwu@nycu.edu.tw
PROFESSIONAL EXPERIENCE
2025.09 – present Joint Professor, Graduate Degree Program of Artificial Intelligence (AI), NYCU
2025.07 – 2025.08 Lecturer, NYCU x Synopsys® Taiwan Semiconductor & IC Camp
2025.02 – present Joint Researcher, Taiwan Semiconductor Research Institute (TSRI)
2024.08 – present Associate Professor, Institute of Electronics (IEE), NYCU
2024.08 – present Associate Professor, Department of Electronics and Electrical Engineering (DEE), NYCU
2024.08 – present Associate Professor, EECS International Graduate Program, NYCU
2024.07 – present IEEE EDS Technical Committees on Electronic Materials
2023.08 – present Editor, Scientific Reports (Nature Journal)
2023.01 – present IEEE EDS Technical Committees on Compound Semiconductor Devices & Circuits
2023.01 – present IEEE EDS Technical Committees on Compact Modeling
2023.01 – present Distinguished Research Fellow, Industrial Technology Research Institute
2022.08 – present Joint Professor, Department of Microelectronics (MEE) NYCU
2022.02 – present Joint Professor, Industrial Academy Innovation School (IAIS), NYCU
2021.10 – present Executive Director, MOST “Next-generation compound semiconductor technologies”
2021.11 – present Trustee, Taiwan ESD Association
2019.09 – present Seeded Trainer, Center of Higher Education Accreditation for Teaching (HEAT)
2021.08 – present Associate Professor, International College of Semiconductor Technology (ICST), NYCU
2017.08 – present MediaTek Junior Chair Professor
2022.08 – 2023.02 Vice Dean, International College of Semiconductor Technology, NYCU
2021.02 – 2021.07 Assistant Professor, International College of Semiconductor Technology, NYCU
2017.02 – 2021.01 Assistant Professor, International College of Semiconductor Technology, NCTU
2016.08 – 2017.01 Research Scientist, Imec, Leuven, Belgium
2011.09 – 2016.07 Ph.D. researcher, Imec, Leuven, Belgium
2016.01 – 2016.03 Visiting researcher, IBM, NY, USA
AWARDS and HONORS
2025 IEEE Senior Membership
2025 NYCU ECE Teaching Award
2024 NYCU Outstanding International Student Mentorship Award
2023 CIEE Outstanding Young Electrical Engineer
2023 NSTC Ta-You Wu Memorial Award
2023 NSTC Excellent Young Scholars Project Award
2023 Outstanding Alumnus, National Chung Hsing University
2022 EDMA Outstanding Young Engineer Award
2022 Excellent Teaching Award, NYCU
2021 TSIA Semiconductor Award – Outstanding New Researcher with a Doctoral Degree
2020 Outstanding Master Thesis Award, Taiwan Inst. of Electrical and Electronic Eng. (TIEEE)
2020 Outstanding Graduate Mentorship Award, NCTU
2020 Fellow of the Higher Education Academy (FHEA), Advanced HE
2019 Featuring case for Taiwan Education Experience Program (TEEP), Ministry of Education (MOE)
2019 MOST Young Scholarship Fellowship, Ministry of Science and Technology (MOST)
2017 MediaTek Junior Chair Professor, MediaTek
2015 Fellowship for long stay abroad research, Flanders Research Foundation (FWO)
2012 Imec Ph.D. Fellowship
2011 Imec Predoctoral scholarship
2006 ENE admission scholarship, National Tsing Hua University (NTHU)
IEEE Electron Device Letters Golden Reviewer 2014, 2015, 2016, 2019
IEEE Transactions on Electron Device Golden Reviewer 2016, 2017, 2018
PROFESSIONAL SERVICE
Technical program committee:
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IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (2019-2022)
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European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF) (2019-2022)
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Electron Devices Technology and Manufacturing (EDTM) Conference (2019, 2020)
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Taiwan ESD and Reliability Conference (TESDC) (2017-2022)
EDUCATION
Ph.D., Electrical Engineering, KU Leuven, Belgium (2016)
Business Strategy & Consulting, Imperial College London, UK (2014)
MS, Electronics Engineering, National Tsing Hua University, Taiwan (2008)
BS, Electrical Engineering, National Chung Hsing University, Taiwan (2006)
Prof. Tian-Li Wu (IEEE Senior Member, HEA Fellow) received the Ph.D. degree in electrical engineering from KU Leuven, Belgium, in 2016. From 2011 to 2017, He was with the GaN power device group at imec, Leuven, Belgium, where he focused on research and development of CMOS compatible 200-mm GaN-on-Si platform for power switching applications and investigation of reliability issues in GaN power devices. In 2016, he visited IBM, New York, NY, USA, where he focused on interface characterization in sub-10nm SiGe pMOS FinFETs. He is currently the Associate Professor with Institute of Electronics (IEE) / Department of Electronics and Electrical Engineering (DEE) / EECS International Graduate Program (EECSIGP) / AI Graduate Program (AIGP) and the Joint Professor with International College of Semiconductor Technology (ICST) and Department of Microelectronics (MEE), at National Yang Ming Chiao Tung University, Hsinchu, Taiwan, and was named the MediaTek Junior Chair Professor in 2017.
He was the recipient of NYCU ECE Teaching Award (2025), CIEE Outstanding Young Electrical Engineer (2023), NSTC Ta-You Wu Memorial Award (2023), EDMA Outstanding Young Engineer Award (2022), TSIA Semiconductor Award – Outstanding New Researcher with a Doctoral Degree (2021), Fellow of the Higher Education Academy (FHEA) in 2020, MOST Young Scholar Fellowship in 2019, MediaTek Junior Chair Professorship in 2017, the Fellowship for long term abroad research from FWO (Flanders Research Foundation) in 2015, and imec Ph.D. Fellowship in 2012.
He authored and coauthored more than 150 publications in peer reviewed journals or conferences. His research interests focus on 1) GaN and SiC Power semiconductor and electronics, 2) Advanced sub-5nm logic devices, and 3) reliability evaluation and degradation and analysis, ) AI-assisted device design and reliability predictions.