top of page

RESEARCH FOCUS

GaN and SiC for power/high frequency applications

Gallium Nitride/Silicon Carbide Semiconductor Technology for Power Saving and High Frequency Communication

Sub-5 nm beyond CMOS

Design of semiconductor materials and components below 5nm

Reliability evaluation and degradation analysis

Reliability assessment and failure mechanism analysis

AI-assisted device design and reliability prediction

Artificial Intelligence in Design and Reliability Evaluation of Semiconductor Components

“Go off and do something wonderful”
-Robert Noyce, Co-founder of Intel

ResearchOverview2021.png
Research1.png
GaN_SiC positions.png
toward low power.jpg
Research2.png
ANNinGaN_edited.jpg
Research3.png

​The testimonial of Monica, a hardware reliability research scientist in Amazon.   

Research4.png

Collaborations

Colloborations.png
bottom of page