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WLab
Advance Semiconductor Technologies
toward Reliability
RESEARCH FOCUS
GaN and SiC for power/high frequency applications
Gallium Nitride/Silicon Carbide Semiconductor Technology for Power Saving and High Frequency Communication
Sub-5 nm beyond CMOS
Design of semiconductor materials and components below 5nm
Reliability evaluation and degradation analysis
Reliability assessment and failure mechanism analysis
AI-assisted device design and reliability prediction
Artificial Intelligence in Design and Reliability Evaluation of Semiconductor Components
“Go off and do something wonderful”
-Robert Noyce, Co-founder of Intel
The testimonial of Monica, a hardware reliability research scientist in Amazon.
Collaborations
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