Tian-Li Wu @ National Yang Ming Chiao Tung University (NYCU) | 吳添立

WLab | Semiconductor x AI x Reliability

2026IRPS

with Prof. Gong Xiao (NUS), Prof. Shimeng Yu (Georgia Tech), and Prof. Kai Ni (Notre Dame) (Left to right)

2025 with Prof. U. Mishra (UCSB/Founder of Transphorm)

AI-Semi in 2020 Future tech

2026IRPS

with Prof. Gong Xiao (NUS), Prof. Shimeng Yu (Georgia Tech), and Prof. Kai Ni (Notre Dame) (Left to right)

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WLab is an international semiconductor research team with members from over 10 countries, focusing on AI-driven semiconductor technologies, advanced device/circuit design, and next-generation high-performance, low-power, and reliable semiconductor systems.

GaN and SiC for power/6G applications
Ferroelectric / 2D / Oxide Semiconductors
Reliability evaluation and degradation analysis
AI-assisted device design and reliability predictions

#Circuit #Device #Design #Reliability #AI

We are looking for self-motivated postdoc/Ph.D./MS/Intern/undergraduate students for the following projects. Drop me an email if you are interested in working with us.

Research projects:
- GaN and SiC for power/6G applications
- Sub-5 nm beyond CMOS
- Reliability evaluation and degradation analysis
- AI-assisted device design and reliability predictions

#Circuit #Device #Design #Reliability #AI

Collaborations

Latest News

Establishing the WISER Semiconductor Reliability Innovation Research Center for next-generation semiconductors

Professor Tian-Li Wu, in collaboration with the global leader in test and measurement, Keysight Technologies, has officially established the Semiconductor Reliability Innovation Research Center 👉 WISER Center ( W Lab I nnovation SE miconductor R eliability Center) . The WISER Center is dedicated to integrating innovative reliability evaluation methodologies with in-depth failure mechanism analysis, establishing a reliability-centric approach to semiconductor device and integ

Feb 22

IRPS 2026: WLab Sets a New Record with 6 Accepted Papers, Spotlighting Reliability Mechanisms in Next-Generation Devices

From SiC to Power GaN, and further to RF GaN and Ferroelectric device reliability, WLab has long been dedicated to reliability research. We continuously explore innovative reliability testing methodologies and the underlying degradation/failure mechanisms, aiming to develop practical strategies to overcome reliability limitations in next-generation compound semiconductors and emerging memory technologies. 📣 Great news! WLab has 6 papers accepted to the 2026 IEEE Internationa

Dec 17, 2025