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Ferroelectric device reliability

  • 作家相片: Admin
    Admin
  • 2022年7月1日
  • 讀畢需時 1 分鐘

Ferroelectric-based technologies are promising for memory, neuromorphic, and low-power logic applications. However, reliability still remains the challenges. Prof. Tian-Li Wu will deliver a tutorial of Ferroelectric device reliability in IEEE IPFA 2022. Welcome to join IPFA 2022.


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