top of page
搜尋

Ferroelectric device reliability

  • 作家相片: Admin
    Admin
  • 2022年7月1日
  • 讀畢需時 1 分鐘

Ferroelectric-based technologies are promising for memory, neuromorphic, and low-power logic applications. However, reliability still remains the challenges. Prof. Tian-Li Wu will deliver a tutorial of Ferroelectric device reliability in IEEE IPFA 2022. Welcome to join IPFA 2022.



 
 
 

Kommentare


NYCU WLab.png

Advance Semiconductor Technologies

toward Reliability

  • Youtube
  • Facebook
  • Linkedin

© 2024 by WLab@National Yang Ming Chiao Tung University 

bottom of page