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WLab
Advance Semiconductor Technologies
toward Reliability
TDB Data Analysis Tool
Time dependent breakdown (TDB) is one of the most important reliability issues that can limit the operation boundaries and lifetime in the electronics.
To effectively analyze the TDDB issues, we develop a TDB data analysis tool for the efficient plots, analysis and lifetime predictions with the flexible criteria.
Features:
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Efficient plots with a huge data set
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Flexible criteria
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Maximum Likelihood Estimation (MLE) for Weibull/Lognormal Distributions
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Efficient lifetime prediction and operation boundaries extractions
Release Note: WlabTDBv2a version 05/31/2021.
Download:
Manual:
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