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RESEARCH FOCUS

GaN and SiC for power/high frequency applications

功率節能及高頻通訊之氮化鎵/碳化矽半導體技術

Sub-5 nm beyond CMOS

5nm以下半導體材料及元件設計

Reliability evaluation and degradation analysis

可靠度評估及失效機制分析

AI-assisted device design and reliability prediction

人工智慧於半導體元件設計及可靠度評估

“Go off and do something wonderful”
- Robert Noyce, Co-founder of Intel

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​The testimonial of Monica, a hardware reliability research scientist in Amazon.   

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Collaborations

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