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WLab
Advance Semiconductor Technologies
toward Reliability
RESEARCH FOCUS
GaN and SiC for power/high frequency applications
功率節能及高頻通訊之氮化鎵/碳化矽半導體技術
Sub-5 nm beyond CMOS
5nm以下半導體材料及元件設計
Reliability evaluation and degradation analysis
可靠度評估及失效機制分析
AI-assisted device design and reliability prediction
人工智慧於半導體元件設計及可靠度評估
“Go off and do something wonderful”
- Robert Noyce, Co-founder of Intel
The testimonial of Monica, a hardware reliability research scientist in Amazon.
Collaborations
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